Products Description
Pressure Cooker Test Chamber, also called PCT chamber, is a device used to simulate high temperature and high humidity or low temperature and low humidity conditions for accelerated aging testing.
It is widely used in electronic products, optoelectronic devices, automotive parts, communication equipment and other industries to judge the reliability, stability and durability of products in extreme environments. The PCT chamber simulates extreme environmental conditions to accelerate the occurrence of product aging, attenuation and failure, thereby evaluating product performance indicators such as service life, durability and reliability.
This test method can provide important support and guarantee for product research and development, production and quality control.

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1. Setting temperature |
+100 ℃~+132 ℃ (saturated steam temperature) |
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1. Humidity range |
100 % saturated vapor humidity |
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1. Working pressure |
0.5 Kg ~ 2.5 Kg / cm2 (the inner barrel is designed to withstand 4 Kg / cm2 ) |
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1. Time range |
000 Hr ~ 999 Hr |
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1. Pressurization time |
0.00 Kg ~ 1.04 Kg / cm2 within about 45 minutes |
Overview of the Autoclave Cooking Test (PCT)
The Autoclave Cooking Test is a test that simulates extreme environmental conditions. It evaluates the ability of a sample to withstand high temperature and high humidity by exposing it to high temperature, high humidity (100% relative humidity) and high pressure.
Purpose of the test
The main purpose of the PCT test is to identify potential defects that may exist in electronic products under extreme environments and eliminate these problems by improving the design and process. In addition, the test also helps manufacturers evaluate the reliability of products and provide data support for quality control and life assessment.
The Pressure Cooker Test Chamber was created specifically for this purpose and can perfectly perform relevant reliability tests on products.
Scope of application
The PCT test is applicable to multiple industries, including aerospace, automobile, electronics, polymer materials, magnetic materials, pharmaceuticals, printed circuit boards (PCBs), semiconductors, liquid crystal displays (LCDs), lighting equipment, and photovoltaic modules. It can evaluate the hygroscopicity of materials, the moisture resistance of semiconductor packages, and improve the environmental and working stress of products by accelerating aging, so as to quickly discover design defects, reduce test costs, and improve product reliability.
As a leading manufacturer of environmental testing equipment, BOTO GROUP has a team of senior technical experts and advanced production equipment to ensure the high quality and stability of test equipment. BOTO can not only provide standard production services, but also provide customized production solutions according to customer needs to help customers optimize product design and improve product competitiveness.
Failure period analysis
Failure period, also known as bathtub curve, shows the failure rate of products at different stages. This includes early failure (due to production defects or design deficiencies), normal period (due to external factors such as environmental changes) and degradation failure (due to material aging or performance degradation).
Failure Mechanisms
High pressure cooking tests may cause the following failure mechanisms:
Corrosion: Water vapor, bias voltage, and impurity ions may cause electrochemical corrosion of IC aluminum wires.
Plastic-encapsulated semiconductor problems: Water vapor may cause polymer materials to depolymerize, change material properties, and cause wire corrosion.
Corrosion of moving metallization areas: Moisture may cause short circuits, solder joints to detach, and other problems.
Popcorn effect: Plastic-encapsulated ICs may burst due to water vaporization at high temperatures.
Ion migration: Moisture can cause shorts between pins.
Pressure Cooker Test Chamber structure
The Pressure Cooker Test Chamber is a pressure vessel with a water heater inside that can produce a 100% humidity environment. During the test, the sample may fail due to a large amount of water condensation.
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