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Product description:
1. Test physical changes of IC, PCB, ceramic semiconductors and other high polymer materials.
2. High and low temperature liquid tanks use forced mixing convection way.
3. Automatically move testing samples from up to down or left to right to preheating, precooling.
4. Use Garden D02TS in hot and cold chambers to reduce the cost.
5. Japan imported LCD touch screen controller.
6. Suitable for water cooling and air cooling.
7. Optional accessories: Temp. recorder and solution.
Liquid type thermal shock chamber specification:
Model | BT-O-01 | BT-O-02 |
Method | Immersion in liquid bath by movement of a sample basket rack | |
Internal Dim.W×H×D(MM) | 200×350×300×2Bath | 260×350×450×2Bath |
Temperature rise time (high temperature bath) | Room temperature to +150°C within 120 minutes | |
Temperature rise time (low tempreature bath) | Room temperature to -65°C within 120 minutes | |
Precool/Preheat Temp.Range | -75.00°C~00.00°C/+600.00°C~160.00°C | |
Shocking Temp.Tange | -65.00°C~00.00°C/+600.00°C~150.00°C | |
Testing Time | 5min | 5min |
Movement Time | Approx.10 seconds | |
Resolution | 0.1°C / 1 min | |
Control Constancy | ±0.2°C | |
Sample basket Kim.W×H×D( mm ) | 10×18×20 | 16×18×35 |
Sample Weight | 1C 2Kg | 1C 5kg |
Controller | 1P | |
Power Source.[K.W.] | AC 1Ψ 220V;3Ψ 380V 60/50Hz | |

Application:
Physical change test of electronic chip IC, PCB, semiconductor ceramic and polymer materials. The high and low temperature liquid tank adopts the forced stirring convection method. The full-automatic up, down, left, and right displacement mechanism is used to move the sample basket to the preheating and pre-cooling troughs, with a round-trip impact. Hot kerosene uses a single same liquid GARDEN D02TS in the high and low temperature tank, reducing the cost of frequent liquid replacement. It adopts the original large LCD Chinese/English display temperature programmable microcomputer controller.
Description:
Automatic Steam Aging Testing Chamber is used to test and determine the parameters, performance of electrical, electronics, other products and materials for high temperature, low temperature, or the temperature of the thermostat test environmental changes. And also is used in electronic connector, semiconductor IC, transistors, diodes, LCD LCD, chip resistance capacitance and components industry electronic components metal pin wetting resistance test before the aging accelerated life time test; Semiconductor and passive components, parts pin oxidation test.

China technical high Accuracy Temperature environment climatic test chamber is available as standard products in a variety of sizes to suit your needs. Our environmental test chambers are often used for steady-state stability testing, basic temperature cycling and accelerated stress testing. In keeping with the needs of today's lab, we designed these temperature and humidity test chambers to have a compact exterior that maximizes the interior workspace.
Lowest temperature: -20 or -70°C (-4 or -100°F)
Highest temperature: 150°C (302°F)
Humidity range: 10 to 98% RH
Chamber size: 5.3 cubic feet
Touch-screen Watlow F4T programmer with Ethernet access
Features:
1. Controlled by microcomputer digital LED.
2. Having time planning function.
3. Having safety device, including multi over-temperature protection and power off when out of water.
4. Testing high temperature/high humidity to spare pares, components.
5. Digital electronic indicators + S.S.R with PID automatic calculation capability.
6. Have time planning function, the maximum setting is 9990 minutes.

We promote customer satisfaction by continuously improving our Hot Selling T20 Brake Chamber with Low Price and Good Packing to enhance our brand image and product appeal. We provide our employees with an ideal platform for self-achievement through fine work. Our company has established a solid and reliable agent and cooperative relationship with many well-known brands, manufacturers at home and abroad, our purchase channels are stable, our credibility is high and we truly solve the worries of users.
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